Journal Of Electronic Testing-theory And Applications SCIE
國際簡稱：J ELECTRON TEST 參考譯名：電子測試理論與應(yīng)用雜志
主要研究方向：工程：電子與電氣-工程技術(shù) 非預(yù)警期刊 審稿周期： 較慢,6-12周
《電子測試理論與應(yīng)用雜志》(Journal Of Electronic Testing-theory And Applications)是一本由Springer US出版的以工程：電子與電氣-工程技術(shù)為研究特色的國際期刊，發(fā)表該領(lǐng)域相關(guān)的原創(chuàng)研究文章、評論文章和綜述文章，及時報道該領(lǐng)域相關(guān)理論、實踐和應(yīng)用學科的最新發(fā)現(xiàn)，旨在促進該學科領(lǐng)域科學信息的快速交流。該期刊是一本未開放期刊，近三年沒有被列入預(yù)警名單。
- 4區(qū) 中科院分區(qū)
- Q4 JCR分區(qū)
- 43 年發(fā)文量
- 1.1 IF影響因子
- 未開放 是否OA
- 31 H-index
- 1990 創(chuàng)刊年份
- Bimonthly 出版周期
- English 出版語言
The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.
Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics:
Testing of VLSI devices printed circuit boards, and electronic systems;
Testing of analog and digital electronic circuits;
Testing of microprocessors, memories, and signal processing devices;
Fault modeling;
Test generation;
Fault simulation;
Testability analysis;
Design for testability;
Synthesis for testability;
Built-in self-test;
Test specification;
Fault tolerance;
Formal verification of hardware;
Simulation for verification;
Design debugging;
AI methods and expert systems for test and diagnosis;
Automatic test equipment (ATE);
Test fixtures;
Electron Beam Test Systems;
Test programming;
Test data analysis;
Economics of testing;
Quality and reliability;
CAD Tools;
Testing of wafer-scale integration devices;
Testing of reliable systems;
Manufacturing yield and design for yield improvement;
Failure mode analysis and process improvement
Journal Of Electronic Testing-theory And Applications期刊信息
- ISSN：0923-8174
- 出版語言：English
- 是否OA：未開放
- E-ISSN：1573-0727
- 出版地區(qū)：UNITED STATES
- 是否預(yù)警：否
- 出版商：Springer US
- 出版周期：Bimonthly
- 創(chuàng)刊時間：1990
- 開源占比：0.047
- Gold OA文章占比：9.56%
- OA被引用占比：0.0092...
- 出版國人文章占比：0
- 出版撤稿占比：0
- 研究類文章占比：100.00%
Journal Of Electronic Testing-theory And Applications CiteScore評價數(shù)據(jù)（2024年最新版）
| CiteScore | SJR | SNIP | CiteScore 指數(shù) | ||||||||
| 2 | 0.271 | 0.518 |
|
名詞解釋：CiteScore 是衡量期刊所發(fā)表文獻的平均受引用次數(shù)，是在 Scopus 中衡量期刊影響力的另一個指標。當年CiteScore 的計算依據(jù)是期刊最近4年（含計算年度）的被引次數(shù)除以該期刊近四年發(fā)表的文獻數(shù)。例如，2022年的 CiteScore 計算方法為：2022年的 CiteScore =2019-2022年收到的對2019-2022年發(fā)表的文件的引用數(shù)量÷2019-2022年發(fā)布的文獻數(shù)量 注：文獻類型包括：文章、評論、會議論文、書籍章節(jié)和數(shù)據(jù)論文。
Journal Of Electronic Testing-theory And Applications中科院評價數(shù)據(jù)
中科院 2023年12月升級版
| Top期刊 | 綜述期刊 | 大類學科 | 小類學科 | ||
| 否 | 否 | 工程技術(shù) | 4區(qū) | ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣 | 4區(qū) |
中科院 2022年12月升級版
| Top期刊 | 綜述期刊 | 大類學科 | 小類學科 | ||
| 否 | 否 | 工程技術(shù) | 4區(qū) | ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣 | 4區(qū) |
中科院 2021年12月舊的升級版
| Top期刊 | 綜述期刊 | 大類學科 | 小類學科 | ||
| 否 | 否 | 工程技術(shù) | 4區(qū) | ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣 | 4區(qū) |
中科院 2021年12月基礎(chǔ)版
| Top期刊 | 綜述期刊 | 大類學科 | 小類學科 | ||
| 否 | 否 | 工程技術(shù) | 4區(qū) | ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣 | 4區(qū) |
中科院 2021年12月升級版
| Top期刊 | 綜述期刊 | 大類學科 | 小類學科 | ||
| 否 | 否 | 工程技術(shù) | 4區(qū) | ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣 | 4區(qū) |
中科院 2020年12月舊的升級版
| Top期刊 | 綜述期刊 | 大類學科 | 小類學科 | ||
| 否 | 否 | 工程技術(shù) | 4區(qū) | ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣 | 4區(qū) |
Journal Of Electronic Testing-theory And Applications JCR評價數(shù)據(jù)（2023-2024年最新版）
| 按JIF指標學科分區(qū) | 收錄子集 | 分區(qū) | 排名 | 百分位 |
| 學科：ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q4 | 278 / 352 |
21.2% |
| 按JCI指標學科分區(qū) | 收錄子集 | 分區(qū) | 排名 | 百分位 |
| 學科：ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q4 | 293 / 354 |
17.37% |
Journal Of Electronic Testing-theory And Applications歷年數(shù)據(jù)統(tǒng)計
影響因子
中科院分區(qū)
Journal Of Electronic Testing-theory And Applications中國學者發(fā)文選摘
-
1、A Layout-Based Rad-Hard DICE Flip-Flop Design
Author: Haibin Wang, Xixi Dai, Younis Mohammed Younis Ibrahim, Hongwen Sun, Issam Nofal, Li Cai, Gang Guo, Zicai Shen, Li Chen
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2019, Vol., , DOI:10.1007/s10836-019-05773-4
-
2、A Semantics-based Translation Method for Automated Verification of SystemC TLM Designs
Author: Yanyan Gao, Xi Li
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 685-695, DOI:10.1007/s10836-013-5406-8
-
3、Efficient Test Compression Technique for SoC Based on Block Merging and Eight Coding
Author: Tie-Bin Wu, Heng-Zhu Liu, Peng-Xia Liu
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 849-859, DOI:10.1007/s10836-013-5415-7
-
4、An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis
Author: Yongcai Ao, Yibing Shi, Wei Zhang, Yanjun Li
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 555-565, DOI:10.1007/s10836-013-5382-z
-
5、Observation-Oriented ATPG and Scan Chain Disabling for Capture Power Reduction
Author: Lung-Jen Lee
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 625-634, DOI:10.1007/s10836-013-5404-x
-
6、Prognostics of Analog Filters Based on Particle Filters Using Frequency Features
Author: Min Li, Weiming Xian, Bing Long, Houjun Wang
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, Vol.29, 567-584, DOI:10.1007/s10836-013-5383-y
-
7、A Novel Compact Model for On-Chip Vertically-Coiled Spiral Inductors
Author: Bing Hou, Tong Liu, Jun Liu, Junli Chen, Faxin Yu, Wenbo Wang
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2016, Vol.32, 649-652, DOI:10.1007/s10836-016-5613-1
-
8、Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits
Author: Haibin Wang, Mulong Li, Xixi Dai, Shuting Shi, Li Chen, Gang Guo
Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2015, Vol.32, 97-103, DOI:10.1007/s10836-015-5559-8
Journal Of Electronic Testing-theory And Applications同類期刊
-
應(yīng)用熱工
Applied Thermal Engineering
中科院 2區(qū) JCR Q1
-
熱科學與工程進展
Thermal Science And Engineering Progress
中科院 3區(qū) JCR Q1
-
巖土學報
Acta Geotechnica
中科院 1區(qū) JCR Q1
-
分離純化技術(shù)
Separation And Purification Technology
中科院 1區(qū) JCR Q1
-
IEEE工業(yè)電子交易
Ieee Transactions On Industrial Electronics
中科院 1區(qū) JCR Q1
-
工程快報
Engineering Letters
中科院 4區(qū) JCR Q4
-
科學儀器回顧
Review Of Scientific Instruments
中科院 4區(qū) JCR Q3
-
國際熱科學雜志
International Journal Of Thermal Sciences
中科院 2區(qū) JCR Q1
免責聲明
若用戶需要出版服務(wù)，請聯(lián)系出版商：SPRINGER, VAN GODEWIJCKSTRAAT 30, DORDRECHT, NETHERLANDS, 3311 GZ。